1. ......................
Author: Singh, Narinder
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing - Data processing ، Integrated circuits,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
1987
2. Advanced simulation and test methodologies for VLSI design
Author: Russell, Gordon.
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Very large scale integration - Testing ، Integrated circuits
Classification :
TK
7874
.
R88
1989
3. Advanced simulation and test methodologies for vlsi design
Author: Russell, Gordon
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits-very large scale integration Design and construction -- Data processing, Computer Aided design, Integrated circuits-very large scale integration Testing, Integrated circuits-very large scale integration Simulation methods
Classification :
TK
7874
.
R77
4. Algorithmic and knowledge based CAD for VLSI /
Author: edited by Gaynor Taylor and Gordon Russell
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Computer-aided design,Expert systems (Computer science),Integrated circuits-- Very large scale integration-- Design and construction-- Data processing,Integrated circuits-- Very large scale integration-- Testing-- Data processing
Classification :
TK7874
.
A416
1992
5. Algorithmic and knowledge based CAD for VLSI
Author: edited by Gaynor Taylor and Gordon Russell
Library: Library of College of Science University of Tehran (Tehran)
Subject: Design and construction -- Data processing ، Integrated circuits -- Very large scale integration,Testing -- Data processing ، Integrated circuits -- Very large scale integration,، Computer-aided design,، Expert systems )Computer science(
Classification :
TK
7874
.
A416
1992
6. An artificial intelligence approach to test generation
Author: Singh, Narinder
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing , Expert systems )Computer science( , Artificial intelligence
Classification :
TK
7874
.
S533
7. An artificial intelligence approach to test generation
Author: Singh, Narinder, 6591-
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits -- Very large scale integration -- Testing -- Data processing,، Expert systems )Computer science(,، Artificial intelligence
Classification :
TK
7874
.
S533
8. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
9. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
10. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
11. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
12. An artificial intelligence approach to test generation
پدیدآورنده : Singh, Narinder, 6591-
موضوع : ، Integrated circuits- Very large scale integration- Testing- Data processing,، Expert systems )Computer science(,، Artificial intelligence
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
13. An artificial intelligence approach to test generation
Author: / by Narinder Singh
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Very large scale integration - Testing - Data processing,Expert systems (Computer science),Artificial intelligence
Classification :
TK
7874
.
S533
1986
14. An experimental approach to CDMA and interference mitigation
Author: / Luca Fanucci ... [et al.]
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Code division multiple access,Mobile communication systems- Equipment and supplies,Integrated circuits- Very large scale integration,Radio circuits
Classification :
TK5103
.
452
.
E95
2004
15. An experimental approach to CDMA and interference mitigation
Author: / Luca Fanucci ... [et al.]
Library: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
Subject: Code division multiple access,Mobile communication systems- Equipment and supplies,Integrated circuits- Very large scale integration,Radio circuits
Classification :
TK5103
.
452
.
E95
2004
16. An experimental approach to CDMA and interference mitigation
Author: / Luca Fanucci ... [et al.]
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Code division multiple access,Mobile communication systems , Equipment and supplies,Integrated circuits , Very large scale integration,Radio circuits,Electronic books. , local
Classification :
E-BOOK
17. An experimental approach to CDMA and interference mitigation
Author: / Luca Fanucci ... [et al.]
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Code division multiple access,Mobile communication systems- Equipment and supplies,Integrated circuits- Very large scale integration,Radio circuits
Classification :
E-BOOK
18. An introduction to logic circuit testing /
Author: Parag K. Lala
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing
19. Built-in test for VLSI
Author: / Paul H. Bardell, William H. McAnny, Jacob Savir
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits--Very large scale integration - Testing
Classification :
TK
7874
.
B374
1987
20. Built-in test for VLSI
Author: / Paul H. Bardell, William H. McAnny, Jacob Savir
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Integrated circuits--Very large scale integration - Testing
Classification :
TK
7874
.
B374
1987
